Publications by authors named "Muireann Anna de H-Ora"
ACS Appl Electron Mater
September 2024
Article Synopsis
- Piezoresponse force microscopy (PFM) is a powerful technique for studying ferroelectric materials at a nanoscale but can produce misleading signals due to electrostatic interactions.
- The study introduces a calibration process and a method to identify the parasitic phase offset, enhancing the accuracy of the phase-amplitude loops.
- The techniques combine switching spectroscopy-PFM (SS-PFM) and Kelvin probe force microscopy (KPFM) to quantify local imprint voltages in various materials, revealing the significance of correct read voltage selection and allowing detailed mapping of imprint voltage variations in BaTiO single crystals.
