Digital speckle shearography setup to measure the field-induced strain map in piezoelectric materials.

Residual or induced strains are important factors in the performance of electronic devices, actuators, and sensors. In this paper, we report the application of digital speckle shearography to obtain the two-dimensional field-induced out-of-plane strain maps in a piezoelectric slab under a varying electric field. Both the free-standing and loaded (pinned) states are investigated.