The X-ray absorption fine structure method was applied for the quantitative analysis of hexavalent Cr in electronic products. The pre-edge peak intensity of the Cr K-edge increased according to the hexavalent Cr amount, and the hexavalent Cr ratio was calculated quantitatively by using the intensity. By combining with inductively coupled plasma atomic emission spectroscopy measurement results that gave the total Cr amount, the absolute amount of hexavalent Cr in chromate conversion coating and plastic samples could be evaluated.
View Article and Find Full Text PDFThe micro-EDXRF (energy dispersive X-ray fluorescence) method was applied to the screening of Pb in micrometer-area samples, such as a Cu contact in electrical components that had been coated by Pb-free Sn-Ag-Cu solder. The reliability of the screening method was evaluated by a comparison with a scanning electron microscope (SEM) observation and a precious chemical analysis method of inductively coupled plasma mass spectrometry (ICP-MS). Some factors that affect the testing reliability, such as the thickness of the solder, the segregation of Pb and Ag, etc.
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