A measurement-based X-ray source model characterization for CT dosimetry computations.

The purpose of this study was to show that the nominal peak tube voltage potential (kVp) and measured half-value layer (HVL) can be used to generate energy spectra and fluence profiles for characterizing a computed tomography (CT) X-ray source, and to validate the source model and an in-house kV X-ray dose computation algorithm (kVDoseCalc) for computing machine- and patient-specific CT dose. Spatial variation of the X-ray source spectra of a Philips Brilliance and a GE Optima Big Bore CT scanner were found by measuring the HVL along the direction of the internal bow-tie filter axes. Third-party software, Spektr, and the nominal kVp settings were used to generate the energy spectra.