Determining the water content of nominally anhydrous minerals at the nanometre scale.

The amount and distribution of water in nominally anhydrous minerals (NAMs) are usually determined by Fourier-transform infrared spectroscopy. This method is limited by the spot size of the beam to the study of samples with dimensions greater than a few micrometers. Here, we demonstrate the potential of using photoinduced force microscopy for the measurement of water in NAMs with samples sizes down to the nanometer scale with a study of water concentration across grain boundaries in forsterite.

Computer-aided manufacturing and focused ion beam technology enable machining of complex micro- and nano-structures.

We present a novel framework for the fabrication of geometrically complex structures at the micro- and nano-scale which relies on the synergy of integrated computer-aided design and manufacturing systems (CAD/CAM) and focused ion beam (FIB) technology in a scanning electron microscope. Here we utilise industry standard G-code syntax, for the first time, to FIB machining by designing geometries with CAD, defining machining strategies and exporting G-codes with CAM and generating a coordinate list-based beam path by using a custom-built interpreter program. This allows the fabrication of complex structures from CAD models using syntax which is readily understood in the general fabrication industry.

Transmission Kikuchi diffraction versus electron back-scattering diffraction: A case study on an electron transparent cross-section of TWIP steel.

The present case study compares transmission Kikuchi diffraction (TKD) with electron back-scattering diffraction (EBSD) on the same area of an electron transparent cross-section of a twinning induced plasticity steel. While TKD expectedly provides better clarity of internal defect substructures in the band contrast map, EBSD returns orientation data that approaches the quality of the TKD map. This was rationalised by Monte Carlo simulations of the electron energy spreads, which showed that due to the geometry-based compromises associated with adapting a conventional EBSD detector (which is off-axis with respect to the incident electron beam) to TKD, a broadening in the electron energy distribution of the forward-scattered electrons collected on the detector phosphor screen, is unavoidable.

Probe current determination in analytical TEM/STEM and its application to the characterization of large area EDS detectors.

A simple procedure, which enables accurate measurement of transmission electron microscopy (TEM)/STEM probe currents using an energy loss spectrometer drift tube is described. The currents obtained are compared with those measured on the fluorescent screen to enable the losses due to secondary and backscattered electrons to be determined. The current values obtained from the drift tube allow the correction of fluorescent screen current densities to yield true current.