Line spectroscopic reflectometry for rapid and large-area thickness measurement.

Thickness measurements in the range of 0.1-1 mm over large optically transparent layers are essential in various manufacturing applications. However, existing non-contact measurement methods, which typically measure a single point or a few points at a time, fall short in their suitability for inline area measurement.

Enhancing obSTORM imaging performance with cubic spline PSF modeling.

Oblique plane microscopy-based single molecule localization microscopy (obSTORM) has shown great potential for super-resolution imaging of thick biological specimens. Despite its compatibility with tissues and small animals, prior uses of the Gaussian point spread function (PSF) model have resulted in limited imaging resolution and a narrow axial localization range. This is due to the poor fit of the Gaussian PSF model with the actual PSF shapes in obSTORM.

Simple and fast calibration method for phase-only spatial light modulators.

Phase-only spatial light modulators (SLMs) are widely used to engineer the phase of light in various applications. However, liquid-crystal-on-silicon SLMs have undesirable spatial variations in phase response and optical flatness across the SLM panel, which must be compensated for accurate phase control. Here, we introduce a simple and fast way to simultaneously extract these two types of SLM nonuniformities at single-pixel resolution using Twyman-Green interferometry without a piezoelectric transducer.