Time-resolved optical spectroscopy (TR-OS) has emerged as a fundamental spectroscopic tool for probing complex materials, to both investigate ground-state-related properties and trigger phase transitions among different states with peculiar electronic and lattice structures. We describe a versatile approach to perform polarization-resolved TR-OS measurements, by combining broadband detection with the capability to simultaneously probe two orthogonal polarization states. This method allows us to probe, with femtoseconds resolution, the frequency-resolved reflectivity or transmittivity variations along two mutually orthogonal directions, matching the principal axis of the crystal structure of the material under scrutiny.
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