Use of a novel infrared wavelength-tunable laser Mueller-matrix polarimetric scatterometer to measure nanostructured optical materials.

Nanostructured optical materials, for example, metamaterials, have unique spectral, directional, and polarimetric properties. Samples designed and fabricated for infrared (IR) wavelengths have been characterized using broadband instruments to measure specular polarimetric transmittance or reflectance as in ellipsometry or integrated hemisphere transmittance or reflectance. We have developed a wavelength-tunable IR Mueller-matrix (Mm) polarimetric scatterometer which uses tunable external-cavity quantum-cascade lasers (EC-QCLs) to tune onto and off of the narrowband spectral resonances of nanostructured optical materials and performed full polarimeteric and directional evaluation to more fully characterize their behavior.

Design considerations regarding ellipsoidal mirror based reflectometers.

Hemi-ellipsoidal mirrors are used in reflection-based measurements due to their ability to collect light scattered from one focal point at the other. In this paper, a radiometric model of this energy transfer is derived for arbitrary mirror and detector geometries. This model is used to examine the imaging characteristics of the mirror away from focus for both diffuse and specular light.