The electronic structure and the formation of polarons in Mo-doped BiVO measured by angle-resolved photoemission spectroscopy.

We experimentally investigated the electronic structure of Mo-doped BiVO high-quality single-crystals with synchrotron radiation-excited angle-resolved photoelectron spectroscopy (ARPES). By photon-energy dependent ARPES, we measured the bulk-derived valence band dispersion along the direction normal to the (010) cleavage plane, while the dispersion along the in-plane directions is obtained by angle-dependent measurements at fixed photon energy. Our data show that the valence band has a width of about 4.