Control charts for the coefficient of variations (γ) are receiving increasing attention as it is able to monitor the stability in the ratio of the standard deviation (σ) over the mean (μ), unlike conventional charts that monitor the μ and/or σ separately. A side-sensitive synthetic (SS) chart for monitoring γ was recently developed for univariate processes. The chart outperforms the non-side-sensitive synthetic (NSS) γ chart.
View Article and Find Full Text PDFBackground: At the end of December 2019, the world in general and Wuhan, the industrial hub of China, in particular, experienced the COVID-19 pandemic. Massive increment of cases and deaths occurred in China and 209 countries in Europe, America, Australia, Asia and Pakistan. Pakistan was first hit by COVID-19 when a case was reported in Karachi on 26 February 2020.
View Article and Find Full Text PDFThe economic-statistical design of the synthetic np chart with estimated process parameter is presented in this study. The effect of process parameter estimation on the expected cost of the synthetic np chart is investigated with the imposed statistical constraints. The minimum number of preliminary subgroups is determined where an almost similar expected cost to the known process parameter case is desired for the given cost model parameters.
View Article and Find Full Text PDFThe memory-type adaptive and non-adaptive control charts are among the best control charts for detecting small-to-moderate changes in the process parameter(s). In this paper, we propose the Crosier CUSUM (CCUSUM), EWMA, adaptive CCUSUM (ACCUSUM) and adaptive EWMA (AEWMA) charts for efficiently monitoring the changes in the covariance matrix of a multivariate normal process without subgrouping. Using extensive Monte Carlo simulations, the length characteristics of these control charts are computed.
View Article and Find Full Text PDFThe usual practice of using a control chart to monitor a process is to take samples from the process with fixed sampling interval (FSI). In this paper, a synthetic X control chart with the variable sampling interval (VSI) feature is proposed for monitoring changes in the process mean. The VSI synthetic X chart integrates the VSI X chart and the VSI conforming run length (CRL) chart.
View Article and Find Full Text PDFDesigns of the double sampling (DS) X chart are traditionally based on the average run length (ARL) criterion. However, the shape of the run length distribution changes with the process mean shifts, ranging from highly skewed when the process is in-control to almost symmetric when the mean shift is large. Therefore, we show that the ARL is a complicated performance measure and that the median run length (MRL) is a more meaningful measure to depend on.
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