Simultaneous secondary electron microscopy in the scanning transmission electron microscope with applications for in situ studies.

Scanning/transmission electron microscopy (STEM) is a powerful characterization tool for a wide range of materials. Over the years, STEMs have been extensively used for in situ studies of structural evolution and dynamic processes. A limited number of STEM instruments are equipped with a secondary electron (SE) detector in addition to the conventional transmitted electron detectors, i.

Peltier cooling for the reduction of carbon contamination in scanning electron microscopy.

We used a novel Peltier anticontamination device (PAC) to reduce carbon contamination upon electron beam irradiation in scanning electron microscopy through a reduction of hydrocarbon molecules in the specimen chamber. Unlike liquid-nitrogen based cold traps, the PAC operates free of user maintenance and is suitable for lengthy imaging sessions without degradation of the anticontamination performance. Its performance as an alternative cold trap method provides considerable reduction of electron beam-assisted carbon build-up.

Polymeric hollow microcapsules (PHM) via cellulose nanocrystal stabilized Pickering emulsion polymerization.

A practical and sustainable method to prepare polymeric hollow microcapsules (PHMs) using cellulose nanocrystal (CNC) stabilized Pickering emulsion polymerization was developed. Pristine CNCs hydrolyzed from wood pulp are hydrophilic and could be employed as emulsifiers to prepare oil-in-water (O/W) Pickering emulsions. The O/W Pickering emulsions were used as templates for the Pickering emulsion polymerization of hydrophobic monomers inside the emulsion droplets.