Publications by authors named "Megan J Cordill"

Self-healing microelectronics are needed for costly applications with limited or without access. They are needed in fields such as space exploration to increase lifetime and decrease both costs and the environmental impact. While advanced self-healing mechanisms for polymers are numerous, practical ways for self-healing in metal films have yet to be found.

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As the need for miniaturized structural and functional materials has increased, the need for precise materials characterizaton has also expanded. Nanoindentation is a popular method that can be used to measure material mechanical behavior which enables high-throughput experiments and, in some cases, can also provide images of the indented area through scanning. Both indenting and scanning can cause tip wear that can influence the measurements.

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More and more flexible, bendable, and stretchable sensors and displays are becoming a reality. While complex engineering and fabrication methods exist to manufacture flexible thin film systems, materials engineering through advanced metallic thin film deposition methods can also be utilized to create robust and long-lasting flexible devices. In this review, materials engineering concepts as well as electro-mechanical testing aspects will be discussed for metallic films.

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Cellulose fibers are a major industrial input, but due to their irregular shape and anisotropic material response, accurate material characterization is difficult. Single fiber tensile testing is the most popular way to estimate the material properties of individual fibers. However, such tests can only be performed along the axis of the fiber and are associated with problems of enforcing restraints.

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Improving the interface stability for nanosized thin films on brittle substrates is crucial for technological applications such as microelectronics because the so-called brittle-ductile interfaces limit their overall reliability. By tuning the thin film properties, interface adhesion can be improved because of extrinsic toughening mechanisms during delamination. In this work, the influence of the film microstructure on interface adhesion was studied on a model brittle-ductile interface consisting of nanosized Cu films on brittle glass substrates.

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Article Synopsis
  • * Research reveals that amorphous aluminum oxide can deform without breaking at room temperature through a process called viscous creep, showing significant ductility.
  • * This finding suggests the potential to create more durable glass materials, enhancing the performance and reliability of electronics and batteries.
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Metallic glasses typically fail in a brittle manner through shear band propagation but can exhibit significant ductility when the sample size is reduced below a few hundreds of nanometers. To date the size effect was mainly demonstrated for free-standing samples and the role of extrinsic setup parameters on the observed behavior is still under debate. Therefore, in the present work we investigated the mechanical properties of polymer-supported sputtered amorphous PdSi thin films with various thicknesses.

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Rapid progress in the reduction of substrate thickness for silicon-based microelectronics leads to a significant reduction of the device bending stiffness and the need to address its implication for the thermo-mechanical fatigue behavior of metallization layers. Results on 5 µm thick Cu films reveal a strong substrate thickness-dependent microstructural evolution. Substrates with = 323 and 220 µm showed that the Cu microstructure exhibits accelerated grain growth and surface roughening.

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A major obstacle in the utilization of Mo thin films in flexible electronics is their brittle fracture behavior. Within this study, alloying with Re is explored as a potential strategy to improve the resistance to fracture. The sputter-deposited MoRe films (with 0 ≤ x ≤ 0.

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The study of electromigration (EM) in metallisations for flexible thin film systems has not been a major concern due to low applied current densities in today's flexible electronic devices. However, the trend towards smaller and more powerful devices demands increasing current densities for future applications, making EM a reliability matter. This work investigates EM in 50 nm Au thin films with a 10 nm Cr adhesion layer on a flexible polyimide substrate at high current densities.

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In order to advance flexible electronic technologies it is important to study the electrical properties of thin metal films on polymer substrates under mechanical load. At the same time, the observation of film deformation and fracture as well as the stresses that are present in the films during straining are also crucial to investigate. To address both the electromechanical and deformation behavior of metal films supported by polymer substrates, in-situ 4 point probe resistance measurements were performed with in-situ atomic force microscopy imaging of the film surface during straining.

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Thin metal films on polymer substrates are of interest for flexible electronic applications and often utilize a thin interlayer to improve adhesion of metal films on flexible substrates. This work investigates the effect of a 10 nm Cr interlayer on the electro-mechanical properties of 50 nm Au films on polyimide substrates. Ex situ and in situ fragmentation experiments reveal the Cr interlayer causes brittle electro-mechanical behaviour, and thin Au films without an interlayer can support strains up to 15% without significantly degrading electrical conductivity.

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Article Synopsis
  • Thin metal films on polymer substrates are crucial for flexible electronic devices, and their mechanical behavior at the interface is key to device reliability.
  • This study explores the deformation of copper films (50-200 nm thick) bonded to polyimide directly or with a 10 nm chromium interlayer, using experiments and simulations.
  • The findings reveal that the chromium interlayer significantly affects crack formation and stress concentration in the copper films, particularly more so in the thinner 50 nm films compared to the thicker 200 nm ones.
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