Element Depletion Due to Missing Boundary Fluorescence in Electron Probe Microanalysis: The Case of Ni in Olivine.

Secondary fluorescence (SF) is known to be a potential source of error in electron probe microanalysis (EPMA) when analyzing for a trace or minor element near a phase boundary. This often overlooked effect leads to a concentration enhancement whenever the neighboring phase contains a high concentration of the analyzed element. Here we show that SF may also lead to a concentration decrease, which can be mistakenly interpreted as a depletion.