() program: the analysis of single-crystal X-ray diffraction data from polycrystalline samples.

This paper presents the () program and its application to the analysis of single-crystal X-ray diffraction (SC-XRD) data from multiphase mixtures of microcrystalline solids and powders. Superposition of numerous reflections originating from a large number of single-crystal domains of the same and/or different (especially unknown) phases usually precludes the sorting of reflections coming from individual domains, making their automatic indexing impossible. The algorithm is designed to quickly find subsets of reflections from individual domains in a whole set of SC-XRD data.