Publications by authors named "Marwan J AbuLeil"

Unwelcomed biofilms are problematic in food industries, surgical devices, marine applications, and wastewater treatment plants, essentially everywhere where there is moisture. Very recently, label-free advanced sensors such as localized and extended surface plasmon resonance (SPR) have been explored as tools for monitoring biofilm formation. However, conventional noble metal SPR substrates suffer from low penetration depth (100-300 nm) into the dielectric medium above the surface, preventing the reliable detection of large entities of single or multi-layered cell assemblies like biofilms which can grow up to a few micrometers or more.

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Ellipsometric Surface Plasmon Resonance (SPR) sensors are known for their relatively simple optical configuration compared to interferometric and optical heterodyne phase interrogation techniques. However, most of the previously explored ellipsometric SPR sensors based on intensity measurements are limited by their real-time applications because phase or polarization shifts are conducted serially. Here we present an ellipsometric SPR sensor based on a Kretschmann-Raether (KR) diverging beam configuration and a pixelated microgrid polarization camera.

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Photonic metamaterials combined with liquid crystals (LCs) for tunability is a great niche for building miniature devices with high performance such as fast flat tunable lenses, tunable filters, and waveplates. Sub-wavelength or nano-grating surfaces are homogenized to uniaxial waveplates with negative birefringence of unique dispersion when the period is less than the wavelength by at least a few times. This uniaxial metasurface, combined with the LC layer, is shown to act as a tunable retardation achromatic waveplate with 8 μm thick LC layer operating over wide spectral and angular ranges, as compared to using two nematic liquid crystal (NLC) retarders of thicknesses on the order of 30-60 μm, when no metasurface is used.

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Extraction of spectral information using liquid crystal (LC) retarders has recently become a topic of great interest because of its importance for creating hyper- and multispectral images in a compact and inexpensive way. However, this method of hyperspectral imaging requires thick LC-layer retarders (50 µm-100 µm and above) to obtain spectral modulation signals for reliable signal reconstruction. This makes the device extremely slow in the case of nematic LCs (NLCs), since the response time of NLCs increases proportionally to the square of the LC-layer thickness, which excludes fast dynamic processes monitoring.

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An ellipso-polarimetric camera integrated with improved field of view tunable achromatic waveplate (AWP) over wide spectral band based on nematic liquid crystal retarders is presented. The AWP operates as half, quarter and full waveplate over a wide range of 430-780nm and wide field of view. The proposed analysis proved that capturing images at these modes is sufficient to extract the ellipsometric parameters: sin(2ψ), cos(Δ) and the Stokes parameters S and S, besides showing the relations in between.

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The wavelength dependence of phase retarders is considered as a challenge in different applications such as polarimetric systems. A novel achromatic waveplate based on two nematic liquid crystal retarders is designed and demonstrated tunable over a wide spectral range using different voltages applied to the two retarders. The achromatic behavior is achieved based on the fact that the dispersion of the retardation of liquid crystals is voltage dependent.

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A new technique for birefringence measurement and extracting the coefficients of the dispersion relation such as Cauchy or Sellmeier equations is proposed. The main principle of the technique is based on finding accurately the wavelengths that the birefringent plate operates as a quarter-wave plate (QWP) and measuring the birefringence at these points. As the projections of the ordinary and extraordinary beams on the analyzer axis interfere, the setup is a form of common path interferometer and these QWP points are the quadrature points at which the sensitivity of the interferometer is optimum.

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