Layered crystals are known to be good candidates for bulk thermoelectric applications as they open new ways to realise highly efficient devices. Two dimensional materials, isolated from layered materials, and their stacking into heterostructures have attracted intense research attention for nanoscale applications due to their high Seebeck coefficient and possibilities to engineer their thermoelectric properties. However, integration to thermoelectric devices is problematic due to their usually high thermal conductivities.
View Article and Find Full Text PDFGraphene's (GR) remarkable mechanical and electrical properties-such as its Young's modulus, low mass per unit area, natural atomic flatness and electrical conductance-would make it an ideal material for micro and nanoelectromechanical systems (MEMS and NEMS). However, the difficulty of attaching GR to supports, coupled with naturally occurring internal defects in a few layer GR can significantly adversely affect the performance of such devices. Here, we have used a combined contact resonance atomic force microscopy (CR-AFM) and ultrasonic force microscopy (UFM) approach to characterise and map with nanoscale spatial resolution GR membrane properties inaccessible to most conventional scanning probe characterisation techniques.
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