Large and Uniform Optical Emission Shifts in Quantum Dots Strained along Their Growth Axis.

We introduce a calibration method to quantify the impact of external mechanical stress on the emission wavelength of distinct quantum dots (QDs). Specifically, these emitters are integrated in a cross-section of a semiconductor core wire and experience a longitudinal strain that is induced by an amorphous capping shell. Detailed numerical simulations show that, thanks to the shell mechanical isotropy, the strain in the core is uniform, which enables a direct comparison of the QD responses.