Complex diffusion behavior of oxygen in nanocrystalline BaTiO3 ceramics.

(18)O/(16)O exchange annealing and subsequent Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) analysis is used to investigate oxygen transport in dense, nanocrystalline (average grain size d ≈ 300 nm) ceramics of nominally un-doped BaTiO3. Isotope penetration profiles are obtained as a function of temperature, 973 < T/K < 1173, at an oxygen activity aO2 = 0.20 and as a function of oxygen activity, 0.