Nowadays, consumer electronics offer computer-vision-based (CV) measurements of dynamic displacements with some trade-offs between sampling frequency, resolution and low cost of the device. This study considers a consumer-grade smartphone camera based on complementary metal-oxide semiconductor (CMOS) technology and investigates the influence of its hardware limitations on the estimation of dynamic displacements, modal parameters and stiffness parameters of bolted connections in a laboratory structure. An algorithm that maximizes the zero-normalized cross-correlation function is employed to extract the dynamic displacements.
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