Publications by authors named "Maria Chuvakova"

Article Synopsis
  • Material thermal conductivity is important for applications such as thermal management and energy harvesting, and understanding the effects of grain boundaries is essential for optimizing material properties.
  • This study presents a new technique for measuring thermal resistance at grain boundaries using a temperature-sensitive scanning probe, achieving high spatial resolution (about 100 nm) and notable sensitivity (2 × 10 K m W) on specific ceramics.
  • Despite challenges in improving sensitivity and measurement material requirements, this method allows for detailed analysis of thermal resistance at the level of individual grain boundaries, which could enhance material design and applications in various microstructured materials.
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Ferroelectric materials based on lead zirconate titanate (PZT) are widely used as sensors and actuators because of their strong piezoelectric activity. However, their application is limited because of the high processing temperature, brittleness, lack of conformal deposition, and a limited possibility to be integrated with the microelectromechanical systems (MEMS). Recent studies on the piezoelectricity in the 2-D materials have demonstrated their potential in these applications, essentially due to their flexibility and integrability with the MEMS.

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The formation of the domain structure by electron beam irradiation in thermally depolarized Ce-doped strontium barium niobate single crystals with free surface and surface covered by a dielectric layer has been studied. The dependences of the domain sizes and domain depth on the irradiated dose have been measured. The circular shape of the isolated domains was obtained.

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Ferroelectric domain structure has been formed under the action of electron beam scanning in congruent lithium niobate single crystal covered by surface dielectric layer. The obtained types of the domain patterns have been considered as subsequent stages of domain structure evolution. The dependence on irradiated charge density of domain density, length, and period of domain rays and stripe domain width was used for characterization of the domain structure evolution.

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