A mechanism of basal spacing reduction in sodium smectitic clay materials in contact with DNAPL wastes.

There has been concern regarding the possible attack of clays in aquitards, slurry walls and landfill liners by dense nonaqueous phase liquid (DNAPL) wastes, resulting in cracking. Despite the fact that a reduction in basal spacing in sodium smectitic clay materials has been linked to cracking, no plausible mechanism by which this reduction occurs in contact with waste DNAPLs has been formulated. To elucidate a mechanism, screening studies were conducted that showed that the combination of an anionic surfactant (AOT), a nonionic surfactant (TritonX-100) and a chlorinated solvent, tetrachloroethylene (PCE), could replicate the basal spacing reduction and cracking behavior of water-saturated bentonite caused by two waste DNAPLs obtained from the field.