Flake thickness is one of the defining properties of graphene-related 2D materials (GR2Ms), and therefore requires reliable, accurate, and reproducible measurements with well-understood uncertainties. This is needed regardless of the production method or manufacturer because it is important for all GR2M products to be globally comparable. An international interlaboratory comparison on thickness measurements of graphene oxide flakes using atomic force microscopy has been completed in technical working area 41 of versailles project on advanced materials and standards.
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December 2006
Cryogenic sapphire oscillators (CSO) developed at the University of Western Australia (UWA) have now been in operation around the world continuously for many years. Such oscillators, due to their excellent spectral purity are essential for interrogating atomic frequency standards at the limit of quantum projection noise; otherwise aliasing effects will dominate the frequency stability due to the periodic sampling between successive interrogations of the atomic transition. Other applications, which have attracted attention in recent years, include tests on fundamental principles of physics, such as tests of Lorentz invariance.
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