Time average vibration fringe analysis using Hilbert transformation.

Quantitative phase information from a single interferogram can be obtained using the Hilbert transform (HT). We have applied the HT method for quantitative evaluation of Bessel fringes obtained in time average TV holography. The method requires only one fringe pattern for the extraction of vibration amplitude and reduces the complexity in quantifying the data experienced in the time average reference bias modulation method, which uses multiple fringe frames.

Time-average TV holography for vibration fringe analysis.

Time-average TV holography is widely used method for vibration measurement. The method generates speckle correlation time-averaged J0 fringes that can be used for full-field qualitative visualization of mode shapes at resonant frequencies of an object under harmonic excitation. In order to map the amplitudes of vibration, quantitative evaluation of the time-averaged fringe pattern is desired.

Simultaneous measurement of out-of-plane displacement and slope using a multiaperture DSPI system and fast Fourier transform.

The simultaneous quantitative measurement of out-of-plane displacement and slope using the fast Fourier transform method with a single three-aperture digital speckle pattern interferometry (DSPI) arrangement is demonstrated. The method coherently combines two sheared object waves with a smooth reference wave at the CCD placed at the image plane of an imaging lens with a three-aperture mask placed in front of it. The apertures also introduce multiple spatial carrier fringes within the speckle.

Experimental study of the phase-shift miscalibration error in phase-shifting interferometry: use of a spectrally resolved white-light interferometer.

The white-light interferogram in a spectrally resolved white-light interferometer is decomposed in its constituent spectral components by a spectrometer and displayed along its chromaticity axis. A piezoelectric transducer phase shifter in such an interferometer can give a desired phase shift of pi/2 only at one wavelength. The phase shift varies continuously at all other wavelengths along the chromaticity axis.

Spectrally resolved phase-shifting interferometry of transparent thin films: sensitivity of thickness measurements.

Spectrally resolved white-light phase-shifting interference microscopy can be used for rapid and accurate measurements of the thickness profile of transparent thin-film layers deposited upon patterned structures exhibiting steps and discontinuities. We examine the sensitivity of this technique and show that it depends on the thickness of the thin-film layer as well as its refractive index. The results of this analysis are also valid for any other method based on measurements of the spectral phase such as wavelength scanning or white-light interferometry.

Spectrally resolved phase-shifting interferometry for accurate group-velocity dispersion measurements.

We report an accurate method to measure the group-velocity dispersion (GVD) of transparent materials by use of spectrally resolved phase-shifting interferometry. The GVD of silica glass slide measured using an eight-step phase-shifting algorithm agrees well with that calculated using the Sellmeier dispersion equation over the entire visible wavelength region, with a rms error of < or =0.0036 microm(-2), better than that of other measurement methods reported so far.

Improved optical profiling using the spectral phase in spectrally resolved white-light interferometry.

In spectrally resolved white-light interferometry (SRWLI), the white-light interferogram is decomposed into its monochromatic constituent. The phase of the monochromatic constituents can be determined using a phase-shifting technique over a range of wavelengths. These phase values have fringe order ambiguity.

Spectrally resolved white-light phase-shifting interference microscopy for thickness-profile measurements of transparent thin film layers on patterned substrates.

We describe how spectrally-resolved white-light phase-shifting interference microscopy with a windowed 8-step algorithm can be used for rapid and accurate measurements of the thickness profile of transparent thin film layers with a wide range of thicknesses deposited upon patterned structures exhibiting steps and discontinuities. An advantage of this technique is that it can be implemented with readily available hardware.