Publications by authors named "M Sanquer"

Sensitive dispersive readouts of single-electron devices ("gate reflectometry") rely on one-port radio-frequency (RF) reflectometry to read out the state of the sensor. A standard practice in reflectometry measurements is to design an impedance transformer to match the impedance of the load to the characteristic impedance of the transmission line and thus obtain the best sensitivity and signal-to-noise ratio. This is particularly important for measuring large impedances, typical for dispersive readouts of single-electron devices because even a small mismatch will cause a strong signal degradation.

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Silicon spin qubits have emerged as a promising path to large-scale quantum processors. In this prospect, the development of scalable qubit readout schemes involving a minimal device overhead is a compelling step. Here we report the implementation of gate-coupled rf reflectometry for the dispersive readout of a fully functional spin qubit device.

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The engineering of a compact qubit unit cell that embeds all quantum functionalities is mandatory for large-scale integration. In addition, these functionalities should present the lowest error rate possible to successfully implement quantum error correction protocols. Electron spins in silicon quantum dots are particularly promising because of their high control fidelity and their potential compatibility with complementary metal-oxide-semiconductor industrial platforms.

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In most superconductors, the transition to the superconducting state is driven by the binding of electrons into Cooper pairs [1]. The condensation of these pairs into a single, phase coherent, quantum state takes place at the same time as their formation at the transition temperature, . A different scenario occurs in some disordered, amorphous, superconductors: Instead of a pairing-driven transition, in-coherent Cooper pairs first pre-form above , causing the opening of a pseudogap, and then, at , condense into the phase coherent superconducting state [2-11].

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Quantum shot noise probes the dynamics of charge transfers through a quantum conductor, reflecting whether quasiparticles flow across the conductor in a steady stream, or in syncopated bursts. We have performed high-sensitivity shot noise measurements in a quantum dot obtained in a silicon metal-oxide-semiconductor field-effect transistor. The quality of our device allows us to precisely associate the different transport regimes and their statistics with the internal state of the quantum dot.

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