Publications by authors named "M Lequime"

In this Letter, we present the design and performance of the frequency-dependent squeezed vacuum source that will be used for the broadband quantum noise reduction of the Advanced Virgo Plus gravitational-wave detector in the upcoming observation run. The frequency-dependent squeezed field is generated by a phase rotation of a frequency-independent squeezed state through a 285 m long, high-finesse, near-detuned optical resonator. With about 8.

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Following on from previous studies on motionless scatterometers based on the use of white light, we propose a new, to the best of our knowledge, experiment of white-light scattering that should overtake the previous ones in most situations. The setup is very simple as it requires only a broadband illumination source and a spectrometer to analyze light scattering at a unique direction. After introducing the principle of the instrument, roughness spectra are extracted for different samples, and the consistency of results is validated at the intersection of bandwidths.

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The measurement of very low reflection coefficients of anti-reflective coated interfaces has become a key issue for the realization of precision instruments such as the giant interferometers used for the detection of gravitational waves. We propose in this paper a method, based on low coherence interferometry and balanced detection, which not only allows to obtain the spectral dependence of this reflection coefficient in amplitude and phase, with a sensitivity of the order of 0.1 ppm and a spectral resolution of 0.

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We apply reverse engineering techniques (RET) to analyze the dehydration process of a sunflower leaf with terahertz time-domain spectroscopy. The multilayer structure of the leaf is extracted with accuracy during the entire process. Time variations of thickness and the complex index are emphasized for all leaf layers (2 cuticules, 2 epiderms, and 2 mesophylls).

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Capitalizing on a previous theoretical paper, we propose a novel approach, to our knowledge, that is different from the usual scattering measurements, one that is free of any mechanical movement or scanning. Scattering is measured along a single direction. Wide-band illumination with a properly chosen wavelength spectrum makes the signal proportional to the sample roughness, or to the higher-order roughness moments.

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