Probing Qubit Memory Errors at the Part-per-Million Level.

Robust qubit memory is essential for quantum computing, both for near-term devices operating without error correction, and for the long-term goal of a fault-tolerant processor. We directly measure the memory error ε_{m} for a ^{43}Ca^{+} trapped-ion qubit in the small-error regime and find ε_{m}<10^{-4} for storage times t≲50  ms. This exceeds gate or measurement times by three orders of magnitude.

High-Fidelity Trapped-Ion Quantum Logic Using Near-Field Microwaves.

We demonstrate a two-qubit logic gate driven by near-field microwaves in a room-temperature microfabricated surface ion trap. We introduce a dynamically decoupled gate method, which stabilizes the qubits against fluctuating energy shifts and avoids the need to null the microwave field. We use the gate to produce a Bell state with fidelity 99.

High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits.

We demonstrate laser-driven two-qubit and single-qubit logic gates with respective fidelities 99.9(1)% and 99.9934(3)%, significantly above the ≈99% minimum threshold level required for fault-tolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap.