compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints.

Micropillar compression is a method of choice to understand mechanics at small scale. It is mainly studied with electron microscopy or white-beam micro-Laue X-ray diffraction. The aim of the present article is to show the possibilities of the use of diffraction with a coherent X-ray beam.

Size-induced twinning in InSb semiconductor during room temperature deformation.

Room-temperature deformation mechanism of InSb micro-pillars has been investigated via a multi-scale experimental approach, where micro-pillars of 2 µm and 5 µm in diameter were first fabricated by focused ion beam (FIB) milling and in situ deformed in the FIB-SEM by micro-compression using a nano-indenter equipped with a flat tip. Strain rate jumps have been performed to determine the strain rate sensitivity coefficient and the related activation volume. The activation volume is found to be of the order of 3-5 b, considering that plasticity is mediated by Shockley partial dislocations.

Variable-Wavelength Quick Scanning Nanofocused X-Ray Microscopy for In Situ Strain and Tilt Mapping.

Compression of micropillars is followed in situ by a quick nanofocused X-ray scanning microscopy technique combined with 3D reciprocal space mapping. Compared to other attempts using X-ray nanobeams, it avoids any motion or vibration that would lead to a destruction of the sample. The technique consists of scanning both the energy of the incident nanofocused X-ray beam and the in-plane translations of the focusing optics along the X-ray beam.

Revealing the role of microstructure architecture on strength and ductility of Ni microwires by in-situ synchrotron X-ray diffraction.

Deformation mechanisms of cold drawn and electropolished nickel microwires are studied by performing in-situ monotonous and cyclic tensile tests under synchrotron radiation. X-ray diffraction tests allow probing elastic strains in the different grain families and establishing a link with the deformation mechanisms taking place within the microwires. The measurements were carried out on several microwires with diameters ranging from as-drawn 100 µm down to 40 µm thinned down by electropolishing.

Evidence of dislocation cross-slip in MAX phase deformed at high temperature.

Ti₂AlN nanolayered ternary alloy has been plastically deformed under confining pressure at 900°C. The dislocation configurations of the deformed material have been analyzed by transmission electron microscopy. The results show a drastic evolution compared to the dislocation configurations observed in the Ti₂AlN samples deformed at room temperature.