Measurement of nanometric displacements by correlating two speckle interferograms.

This paper presents a method to measure nanometric displacement fields using digital speckle pattern interferometry, which can be applied when the generated correlation fringes show less than one complete fringe. The method is based on the evaluation of the correlation between the two speckle interferograms generated by both deformation states of the object. The performance of the proposed method is analyzed using computer-simulated speckle interferograms.