Conventional techniques that measure the concentration of light elements in metallic materials lack high-resolution performance due to their intrinsic limitation of sensitivity. In that context, scanning microwave microscopy has the potential to significantly enhance the quantification of element distribution due to its ability to perform a tomographic investigation of the sample. Scanning microwave microscopy associates the local electromagnetic measurement and the nanoscale resolution of an atomic force microscope.
View Article and Find Full Text PDFNanoparticles formed within an ablation plume produced by the impact of a nanosecond laser pulse on the surface of an aluminum target have been directly measured using small-angle x-ray scattering. The target was immersed in an oxygen-nitrogen gas mixture at atmospheric pressure with the O_{2}/N_{2} ratio being precisely controlled. The results for an increasing oxygen content reveal remarkable effects on the morphology of the generated particles, which include a decrease in the particle volume but a marked increase in its surface ruggedness.
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