Second-order systematic errors in Mueller matrix dual rotating compensator ellipsometry.

We investigate the systematic errors at the second order for a Mueller matrix ellipsometer in the dual rotating compensator configuration. Starting from a general formalism, we derive explicit second-order errors in the Mueller matrix coefficients of a given sample. We present the errors caused by the azimuthal inaccuracy of the optical components and their influences on the measurements.

Systematic errors for a Mueller matrix dual rotating compensator ellipsometer.

The characterization of anisotropic materials and complex systems by ellipsometry has pushed the design of instruments to require the measurement of the full reflection Mueller matrix of the sample with a great precision. Therefore Mueller matrix ellipsometers have emerged over the past twenty years. The values of some coefficients of the matrix can be very small and errors due to noise or systematic errors can induce distored analysis.

Real time in situ ellipsometric and gravimetric monitoring for electrochemistry experiments.

This work describes a new system using real time spectroscopic ellipsometer with simultaneous electrochemical and electrochemical quartz crystal microbalance (EQCM) measurements. This method is particularly adapted to characterize electrolyte/electrode interfaces during electrochemical and chemical processes in liquid medium. The ellipsometer, based on a rotating compensator Horiba Jobin-Yvon ellipsometer, has been adapted to acquire Psi-Delta spectra every 25 ms on a spectral range fixed from 400 to 800 nm.