Publications by authors named "Louise Carlred"

The pathological mechanisms underlying Alzheimer's disease (AD) are still not understood. The disease pathology is characterized by the accumulation and aggregation of amyloid-β (Aβ) peptides into extracellular plaques, however the factors that promote neurotoxic Aβ aggregation remain elusive. Imaging mass spectrometry (IMS) is a powerful technique to comprehensively elucidate the spatial distribution patterns of lipids, peptides and proteins in biological tissues.

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Article Synopsis
  • Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is effective for imaging lipids in biological samples but struggles with proteins due to fragmentation.
  • The authors introduce a novel method using antibody-conjugated liposomes (immunoliposomes) that bind to specific proteins, enabling simultaneous detection of both lipids and proteins with high spatial resolution.
  • This method has been successfully applied to detect amyloid-β (Aβ) in Alzheimer's disease mouse brain tissue, offering insights into lipid-protein interactions and aiding the understanding of neurodegeneration mechanisms.
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The spatial localization of amyloid-β peptide deposits, the major component of senile plaques in Alzheimer's disease (AD), was mapped in transgenic AD mouse brains using time-of-flight secondary ion mass spectrometry (ToF-SIMS), simultaneously with several endogenous molecules that cannot be mapped using conventional immunohistochemistry imaging, including phospholipids, cholesterol and sulfatides. Whereas the endogenous lipids were detected directly, the amyloid-β deposits, which cannot be detected as intact entities with ToF-SIMS because of extensive ion-induced fragmentation, were identified by specific binding of deuterated liposomes to antibodies directed against amyloid-β. Comparative investigation of the amyloid-β deposits using conventional immunohistochemistry and fluorescence microscopy suggests similar sensitivity but a more surface-confined identification due to the shallow penetration depth of the ToF-SIMS signal.

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