Radiation Hardness of 4H-SiC P-N Junction UV Photo-Detector.

4H-SiC based p-n junction UV photo-detectors were irradiated with 600 keV He in the fluence range of 5 × 10 ÷ 5 × 10 ion/cm in order to investigate their radiation hardness. The effects of irradiation on the electro-optical performance were monitored in dark condition and in the UV (200 ÷ 400 nm) range, as well as in the visible region confirming the typical visible blindness of unirradiated and irradiated SiC photo-sensors. A decrease of UV optical responsivity occurred after irradiation and two fluence regimes were identified.