Improved consistency of bond-line thickness when conducting single lap-shear joint tests.

This article details a method for improving the consistency of bond-line thickness during lap-shear sample preparation. This includes the schematic for a lap-shear sample test rig and consideration for controlled variation of the bond-line thickness for up to ten pairs of samples at a time. Concerns regarding the curing of the samples when held on a large heat reservoir are addressed through direct measurement of the bond-rig temperature in combination with the cure chamber temperature.