On the Many Applications of Nanometer-Thin Pure Boron Layers in IC and Microelectromechanical Systems Technology.

An overview is given of the many applications that nm-thin pure boron (PureB) layers can have when deposited on semiconductors such as Si, Ge, and GaN. The application that has been researched in most detail is the fabrication of nm-shallow -like Si diode junctions that are both electrically and chemically very robust. They are presently used commercially in photodiode detectors for extremeultraviolet (EUV) lithography and scanning-electron-microscopy (SEM) systems.

PureB single-photon avalanche diodes for low-energy electron detection down to 200 eV.

Single-photon avalanche diodes (SPADs) have been fabricated on Si using PureB (Pure Boron) chemical-vapor deposition (CVD) to create both a nanometer-thin anode junction and a robust front-entrance window. The device shows high sensitivity to low radiation levels of electrons with energies down to 200 eV when measurements are performed at room temperature where the dark count rate can be as low as 10 Hz. An implicit guard ring, using an n-enhancement implantation in the central region of the diode, is applied, and this gives a very uniform sensitivity across the whole front-entrance window.

Arsenic-Doped High-Resistivity-Silicon Epitaxial Layers for Integrating Low-Capacitance Diodes.

An arsenic doping technique for depositing up to 40-μm-thick high-resistivity layers is presented for fabricating diodes with low RC constants that can be integrated in closely-packed configurations. The doping of the as-grown epi-layers is controlled down to 5 × 10 cm, a value that is solely limited by the cleanness of the epitaxial reactor chamber. To ensure such a low doping concentration, first an As-doped Si seed layer is grown with a concentration of 10 to 10 cm, after which the dopant gas arsine is turned off and a thick lightly-doped epi-layer is deposited.

X-ray nanodiffraction on a single SiGe quantum dot inside a functioning field-effect transistor.

For advanced electronic, optoelectronic, or mechanical nanoscale devices a detailed understanding of their structural properties and in particular the strain state within their active region is of utmost importance. We demonstrate that X-ray nanodiffraction represents an excellent tool to investigate the internal structure of such devices in a nondestructive way by using a focused synchotron X-ray beam with a diameter of 400 nm. We show results on the strain fields in and around a single SiGe island, which serves as stressor for the Si-channel in a fully functioning Si-metal-oxide semiconductor field-effect transistor.