Mining of Wheat Alleles for Goal-Oriented Marker-Assisted Breeding.

Powdery mildew of wheat, caused by f. sp. (), is a devastating disease that seriously reduces yield and quality worldwide.

Genetically Dissecting the Novel Powdery Mildew Resistance Gene in Wheat Breeding Line PBDH1607.

Powdery mildew is one of the most destructive diseases in wheat production. Identifying novel resistance genes and deploying them in new cultivars is the most effective approach to minimize wheat losses caused by powdery mildew. In this study, wheat breeding line PBDH1607 showed high resistance to powdery mildew at both the seedling and adult plant stages.

Bulked Segregant RNA-Seq Provides Distinctive Expression Profile Against Powdery Mildew in the Wheat Genotype YD588.

Wheat powdery mildew, caused by the fungal pathogen f. sp. (), is a destructive disease leading to huge yield losses in production.

Bulked Segregant RNA-Seq Reveals Distinct Expression Profiling in Chinese Wheat Cultivar Jimai 23 Responding to Powdery Mildew.

Wheat powdery mildew, caused by f. sp. (), is one of the most destructive fungal diseases threatening global wheat production.

Characterization of the Powdery Mildew Resistance Gene in the Elite Wheat Cultivar Jimai 23 and Its Application in Marker-Assisted Selection.

Powdery mildew infection of wheat ( L.), caused by f. sp.

Differential photoacoustic microscopy technique.

Photoacoustic microscopy (PAM), whose image quality largely depends on the optical absorption of samples, provides endogenous information for structural and functional imaging. However, PAM technology in general can not provide edge enhancement imaging for absorbing objects. Therefore, PAM and differential microscopy are integrated for the first time in a single technique to obtain an edge enhancement image.