Nanoscale morphology, optical dynamics and gas sensor of porous silicon.

We investigated the multifaceted gas sensing properties of porous silicon thin films electrodeposited onto (100) oriented P-type silicon wafers substrates. Our investigation delves into morphological, optical properties, and sensing capabilities, aiming to optimize their use as efficient gas sensors. Morphological analysis revealed the development of unique surfaces with distinct characteristics compared to untreated sample, yielding substantially rougher yet flat surfaces, corroborated by Minkowski Functionals analysis.

Advanced nano-texture, optical bandgap, and Urbach energy analysis of NiO/Si heterojunctions.

Due to the large number of industrial applications of transparent conductive oxides (TCOs), this study focuses on one of the most important metal oxides. The RF-magnetron sputtering method was used to fabricate NiO thin films on both quartz and silicon substrates at room temperature under flow of Argon and Oxygen. The sputtered samples were annealed in N atmosphere at 400, 500, and 600 °C for 2 hours.

Evaluating structural, morphological, and multifractal aspects of n-ZnO/p-ZnO homojunctions and n-ZnO/p-NiO heterojunctions.

We have investigated the evolution of the structure and surface morphology of n-ZnO/p-ZnO homojunctions and n-ZnO/p-NiO heterojunctions transparent structures deposited by radio frequency-sputtering on quartz (Q)/ITO substrates. X-ray diffraction (XRD) analysis of the as-deposited and annealed ZnO, n-ZnO/p-NiO/Q/ITO, and n-ZnO/p-ZnO/Q/ITO thin films showed that ZnO had a wurtzite hexagonal structure and (002) preferred growth direction. The annealing temperature played a key role in improving the crystalline structure of the films, as evidenced by the changes in the intensity and position of the XRD (002) peak.

ITO:n-ZnO:p-NiO and ITO:n-ZnO:p-NZO thin films: Study of crystalline structures, surface statistical metrics, and optical properties.

The article presents results on fabrication and characterization of transparent, oxide-based junction diodes on quartz substrates. The devices are made by radio frequency magnetron sputtering in the form of sandwich structures: ITO:n-ZnO:p-NiO (homojunction) and ITO:n-ZnO:p-NZO (heterojunction). The microstructure, crystalline structure, and micromorphology features of deposited samples are studied by means of X-ray diffraction, Atomic Force Microscopy, and Scanning Electron Microscopy.

Advanced microstructure, morphology and CO gas sensor properties of Cu/Ni bilayers at nanoscale.

In this study, we investigated the morphology of synthesized Cu/Ni nanoparticles in trace of carbon sources by the co-deposition process of RF sputtering and RF-PECVD methods and localized surface plasmon resonance of CO gas sensing of Cu/Ni nanoparticles. The surface morphology was studied by analyzing 3D micrographs of atomic force microscopy using image processing techniques and fractal/multifractal analyses. The MountainsMap® Premium software with the two-way ANOVA (Variance analysis) and least-significant differences tests were used for statistical analysis.