Nanocrystal size distribution analysis from transmission electron microscopy images.

We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.

Preserving Structure in Model-Free Tracking.

Model-free trackers can track arbitrary objects based on a single (bounding-box) annotation of the object. Whilst the performance of model-free trackers has recently improved significantly, simultaneously tracking multiple objects with similar appearance remains very hard. In this paper, we propose a new multi-object model-free tracker (using a tracking-by-detection framework) that resolves this problem by incorporating spatial constraints between the objects.