A real-time, dual-sensitive shearography system using a single-wavelength laser was developed for simultaneous and dynamic in-plane and out-of-plane strain measurements. The shearography system is capable of measuring crack-tip deformation fields quantitatively. A spatial multiplexing technique based on Fourier transform is employed for simultaneous and dynamic multi-component phase retrieval.
View Article and Find Full Text PDFA temporal electronic speckle pattern interferometry (ESPI) system is proposed for in-plane rotation measurement. The relationship between the rotation angle and the phase change distribution is established and the rotation direction is indicated by the sign of the partial differential of the phase change distribution. Temporal phase modulation is applied in the proposed symmetric illumination ESPI system.
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