X-ray fluorescent method for the analysis of trace elements in bio-materials with correction of the matrix effect.

A method for correcting the matrix effect by measuring the intensity of fluorescent radiation and its absorption by the sample material in the same x-ray optical scheme is proposed. The use of a complex secondary Ag-Ge emitter as a primary radiation source provides a low detection limit for a wide range of chemical elements from Ca (Z = 20) to Mo (Z = 42) in the K-series and from Cd (Z = 48) to Bi (Z = 83) in the L-series. To measure the absorption, the radiation of an additional secondary emitter is used, of which the wavelength can be varied in the range from 0.