We propose a method for determining complex dielectric permittivity dynamics in the gasochromic oxides in the course of their interaction with a gas as well as for estimating the diffusion coefficient into a gasochromic oxide layer. The method is based on analysis of a time evolution of reflection spectra measured in the Kretschmann configuration. The method is demonstrated with a hydrogen-sensitive trilayer including an Au plasmonic film, WO gasochromic oxide layer, and Pt catalyst.
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