Masking mechanisms applied to thin-film coatings for the manufacturing of linear variable filters for two-dimensional array detectors.

We propose a method for manufacturing linear variable interference filters for two-dimensional (2D) array detectors, based on the use of correcting masks combining both rotation and translation movements of the masks and substrates. The major advantage of this method is its capability to produce several identical filters in a single run. 20 mm x 20 mm samples were manufactured with a wavelength ratio almost equal to 2 along the thickness gradient direction.

Transmission behaviors of single mode hollow metallic waveguides dedicated to mid-infrared nulling interferometry.

This paper reports the characterization of hollow metallic waveguides (HMW) to be used as single-mode wavefront filters for nulling interferometry in the 6-20microm range. The measurements presented here were performed using both single-mode and multimode conductive waveguides at 10.6microm.

Dedicated spectrophotometer for localized transmittance and reflectance measurements.

A dedicated spectrophotometer is built to achieve localized transmittance and reflectance measurements. The spatial resolution can be chosen from 100 microm to 2 mm, the spectral resolution from 0.5 to 5 nm, and the spectral range from 400 to 1700 nm.

Optical characterization of an unknown single layer: Institut Fresnel contribution to the Optical Interference Coatings 2004 Topical Meeting Measurement Problem.

We present the characterizations performed at the Institut Fresnel for the Measurement Problem of the Optical Interference Coatings 2004 Topical Meeting. A single layer coated on a fused-silica substrate of unknown composition and parameters is analyzed in terms of optogeometrical parameters, uniformity, and scattering. We determine the refractive index and the average thickness of the coating, then provide the localized determination of the thickness with a 2 mm spatial resolution.