Spectroscopic polarimetry (SP) is a powerful tool for characterization of thin film, polarization optics, semiconductor, and others. However, mechanical polarization modulation of broadband light hampers its application for dynamic monitoring of a sample. In this article, we demonstrate the dynamic SP with features of polarization-modulation-free polarimetry and spectrometer-free spectroscopy benefiting from dual-comb spectroscopy (DCS) using a pair of optical frequency combs (OFCs).
View Article and Find Full Text PDFDigital holography (DH) is a promising method for non-contact surface topography because the reconstructed phase image can visualize the nanometer unevenness in a sample. However, the axial range of this method is limited to the range of the optical wavelength due to the phase wrapping ambiguity. Although the use of two different wavelengths of light and the resulting synthetic wavelength, i.
View Article and Find Full Text PDFOptical frequency combs (OFCs) have attracted attention as optical frequency rulers due to their tooth-like discrete spectra together with their inherent mode-locking nature and phase-locking control to a frequency standard. Based on this concept, their applications until now have been demonstrated in the fields of optical frequency metrology. However, if the utility of OFCs can be further expanded beyond their application by exploiting new aspects of OFCs, this will lead to new developments in optical metrology and instrumentation.
View Article and Find Full Text PDFWe have developed a hyperspectral imaging scheme that involves a combination of dual-comb spectroscopy and Hadamard-transform-based single-pixel imaging. The scheme enables us to obtain 12,000 hyperspectral images of amplitude and phase at a spatial resolution of 46 µm without mechanical scanning. The spectral resolution given by the data point interval in the frequency domain is 20 MHz and the comb mode interval is 100 MHz over a spectral range of 1.
View Article and Find Full Text PDFSpectroscopic ellipsometry is a means of investigating optical and dielectric material responses. Conventional spectroscopic ellipsometry is subject to trade-offs between spectral accuracy, resolution, and measurement time. Polarization modulation has afforded poor performance because of its sensitivity to mechanical vibrational noise, thermal instability, and polarization-wavelength dependency.
View Article and Find Full Text PDFWe propose two subpixel-shift (SPS) imaging methods: a normal SPS (NSPS) and an interleaved SPS (ISPS) method. Both methods use a series of cyclic-Hadamard-mask illuminations and a single channel detector that enhances lateral spatial resolution in proportion to the number of shifts. A sample object (or the illumination mask) is moved in two dimensions in micro-step intervals within the range of an illumination mask unit pixel (or within a range that exceeds it).
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