Laser Thermal Wave Diagnostics of the Thermal Resistance of Soldered and Bonded Joints in Semiconductor Structures.

This paper is a review of recent applications of a laser photothermal mirage technique for sensing and measuring the thermal resistance of joint layers in modern electronic devices. A straightforward theoretical model of the interfacial thermal resistance based on the formation of a thin intermediate layer between jointed solids is described. It was experimentally shown that thermal properties of solder layers cannot be evaluated simply on the base of averaging the thermal properties of solder components.

Device for characterization of thermal effusivity of liquids using photothermal beam deflection.

We propose and study a novel optoelectronic device for thermal characterization of materials. It is based on monitoring the photothermal deflection of a laser beam within a slab of a thermo-optic material in thermal contact with the sample under study. An optical angle sensor is used to measure the laser deflection providing a simple and experimental arrangement.