A Novel Method for Remaining Useful Life Prediction of RF Circuits Based on the Gated Recurrent Unit-Convolutional Neural Network Model.

The remaining useful life (RUL) prediction of RF circuits is an important tool for circuit reliability. Data-driven-based approaches do not require knowledge of the failure mechanism and reduce the dependence on knowledge of complex circuits, and thus can effectively realize RUL prediction. This manuscript proposes a novel RUL prediction method based on a gated recurrent unit-convolutional neural network (GRU-CNN).