Publications by authors named "Kunio Takayanagi"

The detection of lithium ions is required for characterization of lithium ion batteries, since the movement of lithium ions in the battery is one of the key ways to improve the performance. Annular bright field (ABF) imaging enables us to visualize individual lithium atomic columns simultaneously with heavy elements. Furthermore, it has been found that the number of lithium ions at the column is countable when the specimen is thin.

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Fast charge-discharge process has been reported to give a high capacity loss. A nanobattery consisting of a single LiMn2O4 nanowire cathode, ionic liquid electrolyte and lithium titanium oxide anode was developed for in situ transmission electron microscopy. When it was fully charged or discharged within a range of 4 V in less than half an hour (corresponding average C rate: 2.

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A new type of electrochemical cell was developed for in situ transmission electron microscopy observation that enables the electrode materials to be conveniently changed. The electrochemical cell was used to observe the electrochemical growth or dissolution of copper islands on a gold film with simultaneous cyclic voltammetry measurements. The copper islands could be explained by three-dimensional growing model.

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A generic method to determine the aberration center is established, which can be utilized for aberration calculation and axis alignment for aberration corrected electron microscopes. In this method, decentering induced secondary aberrations from inherent primary aberrations are minimized to find the appropriate axis center. The fitness function to find the optimal decentering vector for the axis was defined as a sum of decentering induced secondary aberrations with properly distributed weight values according to the aberration order.

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Article Synopsis
  • New spherical and chromatic aberration correctors were developed using innovative principles to reduce unwanted optical distortions in electron microscopes.
  • The asymmetric correctors operate effectively at 300 kV, managing various aberrations up to the fifth order, though initially struggled with the 6-fold astigmatism.
  • Advanced low-voltage correctors were also designed to specifically tackle 6-fold astigmatism through precise adjustments of magnetic fields, and a novel chromatic aberration corrector demonstrated successful performance using a concave lens effect in a 30-kV transmission electron microscope.
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A through-focus series of annular bright field (ABF) images were observed simultaneously with high-angle annular dark field (HAADF) images of very thin lithium manganese oxide (LiMn₂O₄), a typical cathode material used in lithium ion batteries, using a spherical aberration corrected electron microscope with a 50 pm resolution (R005). The ABF images showed dark dips at the positions of Li and Mn--O atomic columns, which reversed to bright peaks when the defocus sign was changed, as commonly observed in phase contrast images. The optimal defocus for the ABF images was about 2 nm of over-focus, while that for the HAADF images was 2 nm of under-focus for an incident probe with a convergent semi-angle of 30 mrad.

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Boron nitride nanosheets prepared by an exfoliation technique were observed by aberration corrected transmission electron microscopy at 300 kV acceleration voltage. Single boron and nitrogen atoms in a monolayer region were imaged with different image contrast; a boron atom gave 16% less intensity reduction than a nitrogen atom. The number of atoms at each hexagonal ring site was determined by the image intensity that changed discretely with a 0.

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The intensity profile of atomic columns in annular dark field (ADF) images was quantitatively investigated for a silicon (001) crystal using a cold field emission source in an aberration corrected scanning transmission electron microscope. The intensity distribution at the atomic column in the annular dark field image was blurred by increasing the probe current from 10 to 40 pA, which was quantitatively well fit by a simulated distribution convolved by Gaussian envelopes with area proportional to the probe current. The blur of the ADF images was primarily determined by the size of the cold field emission source.

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Article Synopsis
  • ADF-STEM images of an Si (001) crystal were taken using a specialized electron microscope at a high voltage and specific angle, focusing on scattered electrons.
  • The study compared the intensity of these images (related to specimen thickness) with simulations, finding that the experimental results showed a linear increase in intensity as thickness grew, but the simulations predicted higher column intensity and lower background intensity.
  • A Gaussian convolution was used to align the experimental images with simulated results, indicating a consistent measurement across varying thicknesses and discussing potential factors influencing this convolution.
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Tilted illumination exit-wave restoration is compared for two aberration-corrected instruments at different accelerating voltages. The experimental progress of this technique is also reviewed and the significance of off-axial aberrations examined. Finally, the importance of higher order aberration compensation combined with careful correction of the lower order aberrations is highlighted.

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We visualized lithium atom columns in LiV₂O₄ crystals by combining scanning transmission electron microscopy with annular bright field (ABF) imaging using a spherical aberration-corrected electron microscope (R005) viewed from the [110] direction. The incident electron beam was coherent with a convergent angle of 30 mrad (semi-angle), and the detector collected scattered electrons over 20-30 mrad (semi-angle). The ABF image showed dark dots corresponding to lithium, vanadium and oxygen columns.

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A spherical aberration-corrected electron microscope has been developed recently, which is equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic aberration coefficient. A dumbbell image of 47 pm spacing, corresponding to a pair of atomic columns of germanium aligned along the [114] direction, is resolved in high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) with a 0.4-eV energy spread of the electron beam.

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Gold nanowires were synthesized at 150 K by electron beam thinning of a gold thin foil in an UHV electron microscope. The gold nanowires were found to have a helical multishell structure (HMS). One particular nanowire, which was thinner than the 7-1 HMS nanowire, was found to have a tubular structure.

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Helical multishell (HMS) gold nanowires were observed in situ by ultra-high-vacuum electron microscopy. During thinning of the helical nanowire, a junction was formed between two nanowires of different diameter. The structure of the gold junction is proposed in comparison with the multiwall carbon nanotube.

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