QPlus: atomic force microscopy on single-crystal insulators with small oscillation amplitudes at 5 K.

Based on a proven low temperature scanning tunneling microscope (STM) platform, we have integrated a QPlus sensor, which employs a quartz tuning fork for force detection in non-contact atomic force microscopy (AFM). For combined STM operation, this sensor has key advantages over conventional sensors. For quantitative force spectroscopy on insulating thin films or semiconductors, decoupling of the tunneling current and the piezo-electrically induced AFM signal is important.