Versatile inversion tool for phaseless optical diffraction tomography.

Estimating three-dimensional complex permittivity of a sample from the intensity recorded at the image plane of a microscope for various angles of illumination, as in optical Fourier ptychography microscopy, permits one to avoid the interferometric measurements of classical tomographic diffraction microscopes (TDMs). In this work, we present a general inversion scheme for processing intensities that can be applied to any microscope configuration (transmission or reflection, low or high numerical aperture), scattering regime (single or multiple scattering), or sample-holder geometries (with or without substrate). The inversion procedure is tested on a wide variety of synthetic experiments, and the reconstructions are compared to that of TDMs.

Versatile inversion tool for phaseless optical diffraction tomography: publisher's note.

This publisher's note corrects a typo in the title of J. Opt. Soc.