The growth of two-dimensional hexagonal aluminum nitride (h-AlN) on transition metal dichalcogenide (TMD) monolayers exhibits superior uniformity and smoothness compared to HfO on silicon substrate. This makes an h-AlN monolayer an ideal spacer between the gate oxide material and the WSe monolayer in a two-dimensional field effect transistor (FET). From first principles approaches, we calculate and compare the transmission functions and current densities of Pt-WSe-Pt nanojunctions without and with the insertion of an h-AlN monolayer as a spacer in the gate architecture.
View Article and Find Full Text PDFSuperconductivity in bulk rhombohedral Bi has recently been detected to appear below 0.53 mK and 5.2 μT.
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