In this article, the resistive switching (RS) behaviors in Lu2O3 thin film for advanced flexible nonvolatile memory applications are investigated. Amorphous Lu2O3 thin films with a thickness of 20 nm were deposited at room temperature by radio-frequency magnetron sputtering on flexible polyethylene terephthalate substrate. The structural and morphological changes of the Lu2O3 thin film were characterized by x-ray diffraction, atomic force microscopy, and x-ray photoelectron spectroscopy analyses.
View Article and Find Full Text PDFA high-field x-ray diffraction (HF-XRD) camera was developed to observe structural changes of magnetic materials in magnetic fields up to 10 T. The instrument mainly consists of a Debye-Scherrer-type camera with a diameter of 80.1 mm, a 10-T cryocooled superconducting magnet with a 100-mm room-temperature bore, an x-ray source, a power supply, and a chiller for the x-ray source.
View Article and Find Full Text PDFWe investigated the hydrogen effect on superconductivity in the (Ni0.36Nb0.24Zr0.
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February 2009
A system was developed measuring x-ray powder diffraction in high magnetic fields up to 5 T and at temperatures from 283 to 473 K. The stability of the temperature is within 1 K over 6 h. In order to examine the ability of the system, the high-field x-ray diffraction measurements were carried out for Si and a Ni-based ferromagnetic shape-memory alloy.
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April 2008
High-field x-ray diffraction and magnetization measurements and differential thermal analysis (DTA) were carried out for polycrystalline MnBi with an NiAs-type hexagonal structure to investigate its magnetic and structural phase transitions. The lattice parameter rapidly decreases below the spin reorientation temperature (=90 K) in a zero magnetic field. The parameter decreases gradually with decreasing temperature and exhibits an anomaly in the vicinity of .
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