Disentangling neighbors and extended range density oscillations in monatomic amorphous semiconductors.

High energy x-ray diffraction measurements of pure amorphous Ge were made and its radial distribution function (RDF) was determined at high resolution, revealing new information on the atomic structure of amorphous semiconductors. Fine structure in the second peak in the RDF provides evidence that a fraction of third neighbors are closer than some second neighbors; taking this into account leads to a narrow distribution of tetrahedral bond angles, (8.5 ± 0.

High-resolution study of (002, 113, 11-1) four-beam diffraction in Si.

The results of a high-resolution study of the (002, 113, 11 ̅1) four-beam diffraction in Si are presented. The incident synchrotron radiation beam was highly monochromated and collimated with a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes, in an attempt to experimentally approach plane-wave incident conditions. The Renninger scheme was used with the forbidden reflection reciprocal-lattice vector 002 normal to the crystal surface.

Atomic imaging of oxide-supported metallic nanocrystals.

The nucleation of noble metal nanoparticles on oxide surfaces can lead to dramatic enhancements in catalytic activity that are related to the atomic-scale formation of the nanoparticles and interfaces. For the case of submonolayer Pt deposited on the 2×1 SrTiO(3)(001) surface atomic-force microscopy shows the formation of nanoparticles. We use X-ray standing wave (XSW) atomic imaging to show that these nanoparticles are composed of Pt face-centered-cubic nanocrystals with cube-on-cube epitaxy laterally correlated to the substrate unit cell.

High-resolution study of (222, 113) three-beam diffraction in Ge.

The results of high-resolution analysis of the (222, >113) three-beam diffraction in Ge are presented. For monochromatization and angular collimation of the incident synchrotron beam a multi-crystal arrangement in a dispersive setup in both vertical and horizontal planes was used in an attempt to experimentally approach plane-wave incident conditions. Using this setup, for various azimuthal angles the polar angular curves which are very close to theoretical computer simulations for the plane monochromatic wave were measured.

Cosputtered composition-spread reproducibility established by high-throughput x-ray fluorescence.

We describe the characterization of sputtered yttria-zirconia composition spread thin films by x-ray fluorescence (XRF). We also discuss our automated analysis of the XRF data, which was collected in a high throughput experiment at the Cornell High Energy Synchrotron Source. The results indicate that both the composition reproducibility of the library deposition and the composition measurements have a precision of better than 1 atomic percent.

High-resolution study of dynamical diffraction phenomena accompanying the Renninger (222/113) case of three-beam diffraction in silicon.

X-ray optical schemes capable of producing a highly monochromatic beam with high angular collimation in both the vertical and horizontal planes have been evaluated and utilized to study high-resolution diffraction phenomena in the Renninger (222/113) case of three-beam diffraction in silicon. The effect of the total reflection of the incident beam into the nearly forbidden reflected beam was observed for the first time with the maximum 222 reflectivity at the 70% level. We have demonstrated that the width of the 222 reflection can be varied many times by tuning the azimuthal angle by only a few microrad in the vicinity of the three-beam diffraction region.

High energy x-ray diffraction/x-ray fluorescence spectroscopy for high-throughput analysis of composition spread thin films.

High-throughput crystallography is an important tool in materials research, particularly for the rapid assessment of structure-property relationships. We present a technique for simultaneous acquisition of diffraction images and fluorescence spectra on a continuous composition spread thin film using a 60 keV x-ray source. Subsequent noninteractive data processing provides maps of the diffraction profiles, thin film fiber texture, and composition.

Spatial structure of a focused X-ray beam diffracted from crystals.

The spatial structure of a beam focused by a planar refractive lens and Bragg diffracted from perfect silicon crystals was experimentally studied at the focal plane using a knife-edge scan and a high-resolution CCD camera. The use of refractive lenses allowed for a detailed comparison with theory. It was shown that diffraction leads to broadening of the focused beam owing to the extinction effect and, for a sufficiently thin crystal, to the appearance of a second peak owing to reflection from the back surface.

[Significance of some growth factors in the pathogenesis of chronic gastritis in children].

Gastric biopsy specimens taken from 44 children aged 7 to 15 years who had a clinical diagnosis of chronic gastritis (CG) were studied. In Helicobacter pylori (Hp)-associated CG (n = 24), there were accelerated cell regeneration processes in the antral and fundal mucosae as compared with the rate of proliferation and apoptosis in Hp-unassociated CG (n = 20). The increased proliferation of gastric mucosal (GM) elements has been shown to be associated with the high density of EGFR, in Hp-associated CG in particular, which is generally observed in the insufficient level of TGFR-beta.

Highly aligned epitaxial nanorods with a checkerboard pattern in oxide films.

One of the central challenges of nanoscience is fabrication of nanoscale structures with well-controlled architectures using planar thin-film technology. Herein, we report that ordered nanocheckerboards in ZnMnGaO4 films were grown epitaxially on single-crystal MgO substrates by utilizing a solid-state method of the phase separation-induced self-assembly. The films consist of two types of chemically distinct and regularly spaced nanorods with mutually coherent interfaces, approximately 4 x 4 x 750 nm3 in size and perfectly aligned along the film growth direction.

A methodology for measuring in situ lattice strain of bulk polycrystalline material under cyclic load.

The material response of polycrystalline materials under cyclic loading is not fully understood. Even during uniaxial loading, individual grains embedded within the polycrystalline material can experience complicated strain histories. By quantifying the deformation state at the crystal level, we can begin to understand the conditions that lead to fatigue failure.

Dynamics of bimodal growth in pentacene thin films.

Previous studies have established that pentacene films deposited on silicon oxide consist of a substrate-induced "thin-film" phase, with the bulk phase of pentacene detected in thicker films only. We show that the bulk phase nucleates as early as the first monolayer, and continues to nucleate as film growth progresses, shadowing the growth of the thin-film phase. Moreover, we find that the transition between the "thin-film" and the bulk phase is not a continuous one, as observed in heteroepitaxial systems, but rather the two phases nucleate and grow independently.

Multilayer X-ray optics at CHESS.

Almost half of the X-ray beamlines at the Cornell High Energy Synchrotron Source (CHESS) are based on multilayer optics. ;Traditional' multilayers with an energy resolution of DeltaE/E approximately 2% are routinely used to deliver X-ray flux enhanced by a factor of 10(2) in comparison with standard Si(111) optics. Sagittal-focusing multilayers with fixed radius provide an additional factor of 10 gain in flux density.

[Influence of beta-radiation on human erythrocyte surface potential under eicosanoid metabolism inhibition].

The aim of the research consisted in the study of influence of beta-radiation on response of erythrocyte surface potential to inhibitors of eicosanoid metabolism enzymes (cyclo-, lipoxygenase and phospholipase A2). It was shown, that inhibitors of phospholipase A2 (quinacrine, 10-100 microM), cyclooxygenase (aspirin, 10-100 microM) and cyclo- and lipoxygenase (BW755c, 1-100 microM) lowered electrophoretic mobility (EPM) of erythrocytes by 20-30%. An analogous effect can be exerted by beta-radiation.

Crystallographic data collection using a 0.22% bandwidth multilayer.

To bridge the gap between traditional multilayer and crystal optics a high-resolution multilayer monochromator with a bandwidth of 0.22% has been designed and installed on a bending-magnet beamline (F3) at the Cornell High Energy Synchrotron Source (CHESS) to provide an unfocused monochromatic X-ray beam for protein crystallography experiments. Crystallographic data of excellent quality from a medium-sized protein, Concanavalin A, were collected and processed using standard crystallographic programs.

Real-time observation of dendrite coarsening in Sn-13%Bi alloy by synchrotron microradiography.

An improved synchrotron microradiography technique is being used to study dendrite growth and coarsening in Sn-13%Bi alloy in real time. The morphology of growing dendrites can be well resolved with reasonable image contrast. Dendrite arm remelting, coalescence, and fragmentation have been observed in a real alloy and in real time during solidification under controlled thermal gradients and cooling rates.

X-ray standing wave analysis of the effect of isotopic composition on the lattice constants of Si and Ge.

The x-ray standing wave (XSW) technique is used to measure the isotopic mass dependence of the lattice constants of Si and Ge. Backreflection allows substrates of moderate crystallinity to be used while high order reflection yields high accuracy. The XSW, generated by the substrate, serves as a reference for the lattice planes of an epilayer of different isotopic composition.

Isotopic mass and lattice constant: X-ray standing wave measurements.

The molecular volume of crystals depends on their isotopic masses. This influence originates from the zero-point motion and the resulting small differences in lattice constants. This effect was measured with high precision by using an x-ray standing wave.